The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[30a-D3-1~13] 6.6 Probe microscopy

Sat. Mar 30, 2013 9:00 AM - 12:30 PM D3 (C5 3F-324)

[30a-D3-4] Stroboscopic Imaging of AC Magnetic Field by Alternating Magnetic Force Microscopy

Hitoshi Saito1,3, Shinya Yasui1, Genta Egawa1,3, Satoru Yoshimura1,3, Yukinori Kinoshita2,3 (Akita Univ.1, VBL, Akita Univ.2, JST/Adv. Meas. & Analysis3)

Keywords:磁気力顕微鏡