[30a-G6-3] Nanoscale Investigation on Corrosion of Copper Wire in Dilute Electrolyte Solution by Atomic Force Microscopy
Keywords:原子間力顕微鏡、腐食
Regular sessions(Oral presentation)
13. Semiconductors A (Silicon) » 13.4 Interconnection technology
Sat. Mar 30, 2013 9:00 AM - 12:00 PM G6 (B5 1F-2106)
Keywords:原子間力顕微鏡、腐食