The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

13. Semiconductors A (Silicon) » 13.4 Interconnection technology

[30a-G6-1~11] 13.4 Interconnection technology

Sat. Mar 30, 2013 9:00 AM - 12:00 PM G6 (B5 1F-2106)

[30a-G6-3] Nanoscale Investigation on Corrosion of Copper Wire in Dilute Electrolyte Solution by Atomic Force Microscopy

Shoichiro Ogata1, Naritaka Kobayashi1, Chikako Takatoh2, Shohei Shima2, Akira Fukunaga2, Hitoshi Asakawa3, Takeshi Fukuma1,3 (Dept. of Eng., Kanazawa Univ1, Ebara Corporation2, Bio-AFM Research Center, Kanazawa Univ3)

Keywords:原子間力顕微鏡、腐食