141 results
(81 - 100)
Super High Vertical Resolution Non-Contact 3D Surface Profiler BW-S501
Micro Exposure System
■SQUID磁化率測定装置 ■物理物性特性装置 ■無冷媒顕微用クライオスタット ■超電導マグネットシステム ■温度コントローラ ■温度センサー
Princeton Instruments CCD cameras and Spectrographs. , PL,Raman Systems
TBD
■機器分析データ統合管理・解析支援システム「ChartSpect」 ■クラウド型電子実験ノート「Accelrys Notebook」
KTN Deflector, KTN Vari-Focal Lens, KTN Crystal, 200kHz Swept Light Source, Foundry Service, Molds for Nanoimprinting, Compact Supercritical Dryer, Pressurization/Decompression Desktop Clean Oven
■小型分光器 ■積分球 ■レーザー
Laser Power Meter & Laser Energy Meter, Laser Beam Profiler
Optical Component foe OCT
Light Source , LD Driver , Polarization Control Related Products , Wavelength Control Related Products , Delay Time Control Related Products , Intensity Control Relate , Products , Testing Instrume...
Ocean Optics:Miniature Spectrometer, Labsphere:Integrating Sphere, Admesy:Colorimeter, NN-LABS:Nanocrystals
SIC Wafer(Sole Agent in Japan/SiC Wafer), Reclaiming of SiC Wafer, High Purity AlN Susceptor for MOCVD, MICRO RESIST TECHNOLOGY(Sole Agent in Japan)
Quantum Efficiency Measurement System:QE-2000, Film Thickness Monitor:FE-300
TBD
Single Crystals, QPM device, CW 3-BAND Laser, CW 266nm DUV Laser, Component
Surface Analyzer using Atom Scattering, PLD/ Laser MBE system, 4K GM Cryo Cooler System, Vacuum Pump, Gauge, Valve etc.
TBD
Liquid Crystal Tunable Filter, Fiber input Spectrometer, O/E Convertor
■無冷媒型物理特性測定装置 DynaCool ■磁気特性測定装置 ■超低振動クライオスタット ■非接触式粘度計