Session information

Symposium

Symposium » Phase problem in the analysis of buried interfaces by X-ray reflectivity andsurface X-ray scattering - Towards new research with coherent light sources

[17a-A13-1~5] Phase problem in the analysis of buried interfaces by X-ray reflectivity andsurface X-ray scattering - Towards new research with coherent light sources

Wed. Sep 17, 2014 9:30 AM - 12:15 PM A13 (E304)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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9:30 AM - 9:45 AM

[17a-A13-1] Possible breakthrough in the analysis of X-ray reflectivity data

^○Kenji Sakurai¹ (Nat. Inst for Mater. Sci.¹)

9:45 AM - 10:30 AM

[17a-A13-2] Preset status and prospects of solving the phase problem in surface X-ray diffraction

^○Toshio Takahashi¹ (ISSP, Univ. of Tokyo¹)

10:30 AM - 11:00 AM

[17a-A13-3] Effects of Coherency in Modelling and Analysis of GISAS Intensity

^○Hiroshi Okuda¹ (Dept.Mater.Sci.Eng. Kyoto Univ.¹)

Break 11:00～11:15 (11:00 AM - 11:15 AM)

11:15 AM - 11:45 AM

[17a-A13-4] X-ray standing waves for phasing in surface and thin film crystallography

^○Osami Sakata^1,2 (National Institute for Materials Science¹, Tokyo Institute of Technology²)

11:45 AM - 12:15 PM

[17a-A13-5] Imaging atoms at surfaces and interfaces by synchrotron X-ray diffraction

^○Hiroo Tajiri¹ (JASRI/SPring-8¹)

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