The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[17a-A10-1~11] 6.3 Oxide-based electronics

Wed. Sep 17, 2014 9:00 AM - 11:45 AM A10 (E214)

10:00 AM - 10:15 AM

[17a-A10-5] Dopant configuration analysis of YSZ from multivariable analysis combined with first principles calculations

Seiji Takemoto1,2, Tomofumi Tada1,2 (Tokyo TECH1, JST-CREST2)

Keywords:第一原理計算,dopant,イットリア安定化ジルコニア