9:45 AM - 10:00 AM
△ [17a-A27-4] In-situ cross-sectional observation of operated SiC-DMOSFET using super-higher-order nonlinear dielectric microscopy
Keywords:SiC,SNDM
Oral presentation
Code-sharing session » 14.3/15.4 Code-sharing session
Wed. Sep 17, 2014 9:00 AM - 12:00 PM A27 (N302)
9:45 AM - 10:00 AM
Keywords:SiC,SNDM