[17a-PB4-1~21] 16.3 Bulk, thin-film and other silicon-based solar cells

[17a-PB4-1] Evaluation of iron impurity distribution and mc-silicon grains by PL and EBSD mapping for Mössbauer Mapping experiments

^○Yuji Ino¹, Kiyotaka Tanaka¹, Takeshi Hanada², Yoshihito Harada³, Keiko Ogai³, Kouichi Moriguchi³, Yutaka Yoshida¹ (Shizuoka Inst. Sci & Tech.¹, Bruker AXS², APCO³)

Keywords:多結晶シリコン,EBSDマッピング,メスバウア分光