The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

08. Plasma Electronics » 8.2 Plasma measurements and diagnostics

[17p-S11-1~6] 8.2 Plasma measurements and diagnostics

Wed. Sep 17, 2014 4:30 PM - 6:00 PM S11 (S11)

5:45 PM - 6:00 PM

[17p-S11-6] Effects of Electrostatic Probe Measurements on a Spontaneous-Focusing State in High-Current-Density and Low-Energy Ion Beam Using the Concave shape of Electrodes

Yutaka Fujiwara1,2, Yoichi Hirano2,3, Satoru Kiyama2, Akihisa Nakamiya1,2, Haruhisa Koguchi2, Hajime Sakakita1,2 (Univ. of Tsukuba1, ETRI, AIST2, Phys. CST, Nihon Univ.3)

Keywords:Ion beam,Electrostatic probe,Spontaneous focusing