[18a-A2-1~11] 12.2 Evaluation and basic properties

[18a-A2-6] A study of pentacene thin film thickness using in situ GISAXS measurement.

^○(PC)Takeshi Watanabe¹, Tomoyuki Koganezawa¹, Mamoru Kikuchi², Noriyuki Yoshimoto², Ichiro Hirosawa¹ (JASRI¹, Iwate Univ.²)

Keywords:有機半導体,小角X線散乱,散漫散乱