[18a-A26-1~6] 16.1 Fundamental properties and their evaluation in disordered materials

[18a-A26-2] Evaluation of Thermal Stability of TRAM (topological-switching RAM) Devices

^○Mitsuharu Tai¹, Takasumi Ohyanagi¹, Masaharu Kinoshita¹, Takahiro Morikawa¹, Kenichi Akita¹, Norikatsu Takaura¹, Shigenori Kato², Hiroki Shirakawa², Masaaki Araidai³, Kenji Shiraishi³ (LEAP¹, Tsukuba Univ.², Nagoya Univ.³)

Keywords:超格子,ストレージデバイス