8:45 AM - 9:00 AM
△ [18a-C5-2] Characterization of relaxation process in GaInN/GaN heterostructure
Keywords:GaInN,その場観察X線回折測定法,格子緩和
Oral presentation
15. Crystal Engineering » 15.4 III-V-group nitride crystals
Thu. Sep 18, 2014 8:30 AM - 12:30 PM C5 (Open Hall)
8:45 AM - 9:00 AM
Keywords:GaInN,その場観察X線回折測定法,格子緩和