[18p-PA8-1~8] 6.6 Probe microscopy

[18p-PA8-8] A trial for Force Mapping Measurements under X-ray Irradiation by Means of X-ray Aided Noncontact Atomic Force Microscopy (XANAM)

^○Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Kiyotaka Asakura² (Nagoya Univ.¹, Hokkaido Univ.², ICU³, KEK-PF⁴)

Keywords:放射光X線,非接触原子間力顕微鏡,元素分析