The 75th JSAP Autumn Meeting, 2014

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Oral presentation

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

[19a-A14-1~10] 7.2 Electron microscopes, evaluation, measurement and analysis

Fri. Sep 19, 2014 9:00 AM - 11:45 AM A14 (E305)

9:00 AM - 9:15 AM

[19a-A14-1] Quantitative Analysis of Crystal Structure by ABF Phase Imaging

○Takafumi Ishida1, Tadahiro Kawasaki2,3, Takayoshi Tanji2 (Nagoya Univ.1, Nagoya Univ. EcoTopia Sci. Inst.2, JFCC3)

Keywords:走査透過電子顕微鏡,位相再生