Aberration-corrected Environmental TEM Observation of the Surface Structure of Pt Nanoparticles

Presentation information

Oral presentation

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

Fri. Sep 19, 2014 9:00 AM - 11:45 AM A14 (E305)

11:00 AM - 11:15 AM

^○Hideto Yoshida¹, Hiroki Omote^1,2, Seiji Takeda¹ (ISIR, Osaka Univ.¹, Graduate School of Engineering, Osaka Univ.²)

Keywords:白金,ナノ粒子,環境TEM