The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19a-A15-1~9] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Fri. Sep 19, 2014 9:30 AM - 12:00 PM A15 (E306)

10:30 AM - 10:45 AM

[19a-A15-5] Ab initio analysis on the stability of metal atoms in silicon oxide and silicon nitride.

○(M2)Daiki Shibata1, Syunsuke Kobayashi1, Koji Sueoka1 (Okayama Pref. Univ.1)

Keywords:Si酸化膜,Si窒化膜,第一原理計算