The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19a-A15-1~9] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Fri. Sep 19, 2014 9:30 AM - 12:00 PM A15 (E306)

11:00 AM - 11:15 AM

[19a-A15-6] First-principles X-ray photoelectron spectroscopy calculation on the arsenic defects in silicon crystal

Jun Yamauchi1, Hiroki Kishi1, Miki Miyazawa1 (Keio University1)

Keywords:X線光電子分光,第一原理計算,ヒ素