[19a-A25-1~13] 16.3 Bulk, thin-film and other silicon-based solar cells

[19a-A25-4] Photothermal radiometry for estimation of defect density in silicon thim films (Ⅱ)

^○Hiroki Kondo¹, Akihiro Yasui², Yosuke Matsuda³, Katsunori Ishii⁴, Shogo Takahashi⁵, Norimitsu Yoshida⁶, Shuichi Nonomura⁷ (Gifu Univ.¹, Gifu Univ.², Gifu Univ.³, Gifu Univ.⁴, Gifu Univ.⁵, Gifu Univ.⁶, Gifu Univ.⁷)

Keywords:光熱輻射分光法,シリコン系薄膜,欠陥密度評価