[19a-A25-1~13] 16.3 Bulk, thin-film and other silicon-based solar cells

[19a-A25-6] Evaluation of Defect in a-SiO_x:H films

^○Kento Matsui¹, Takashi Itoh¹, Ryuichi Katayama¹, Koki Yamakawa¹, Masaru Saito², Shuuichiro Sugiyama², Porponth Sichanugrist³, Shuichi Nonomura¹, Makoto Konagai³ (Gifu Univ¹, Sharp Corp², Tokyo Institute of Technology³)

Keywords:欠陥評価