The 75th JSAP Autumn Meeting, 2014

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Oral presentation

07. Beam Technology and Nanofabrication » 7.1 X-ray technologies

[19p-A13-1~14] 7.1 X-ray technologies

Fri. Sep 19, 2014 1:15 PM - 5:00 PM A13 (E304)

4:15 PM - 4:30 PM

[19p-A13-12] Multilayer mirror method for analysis of higher order diffraction impurities in grating monochromator output

○Tadashi Hatano1, Tetsuo Harada2 (IMRAM, Tohoku Univ.1, LASTI, Univ. of Hyogo2)

Keywords:分光器,多層膜,高次回折