Observation of a BaSi2 pn junction on Si(111) by Kelvin probe force microscopy

Daichi Tsukahara

Presentation information

Oral presentation

14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.1 Physical properties of exploratory materials

[19p-A27-1~17] 14.1 Physical properties of exploratory materials

Fri. Sep 19, 2014 2:00 PM - 6:45 PM A27 (N302)

2:15 PM - 2:30 PM

[19p-A27-2] Observation of a BaSi2 pn junction on Si(111) by Kelvin probe force microscopy

^○Daichi Tsukahara¹, Masakazu Baba¹, Kaoru Toko¹, Takashi Kimura², Kentaro Watanabe^1,2, Takashi Sekiguchi², Takashi Suemasu^1,3 (Univ. Tsukuba¹, NIMS², JST-CREST³)

Keywords:BaSi2,KFM

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