The 75th JSAP Autumn Meeting, 2014

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-A8-1~19] 6.6 Probe microscopy

Fri. Sep 19, 2014 1:45 PM - 7:00 PM A8 (E207)

4:15 PM - 4:30 PM

[19p-A8-10] Electronic state analysis on an NH3-reacted Si(111)7×7 surface by nc-AFM/Spectroscopy

○(M2)yuki sakano1, masahiko tomitori2, toyoko arai1 (kanazawa Univ.1, JAIST2)

Keywords:原子間力顕微鏡,Si(111)