Analysis of Quantum Well by BEEM and evaluation of their interfaces

Presentation information

Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

Fri. Sep 19, 2014 1:45 PM - 7:00 PM A8 (E207)

3:15 PM - 3:30 PM

^○(M1)Kenta Imamiya¹, Shigeru Kaku¹, Masayuki Tsukui¹, Junji Yoshino¹ (Tokyo Tech¹)

Keywords:BEEM