The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-A8-1~19] 6.6 Probe microscopy

Fri. Sep 19, 2014 1:45 PM - 7:00 PM A8 (E207)

4:00 PM - 4:15 PM

[19p-A8-9] The elucidation of the local contact potential difference on the rutile TiO2(110) with Kelvin probe force microscopy

Ryosuke Kanbayashi1, Huanfei Wen1, Masahide Suesada1, Yoshitaka Naitoh1, Yanjun Li1, Yasuhiro Sugawara1 (Osaka Univ.1)

Keywords:ルチル型二酸化チタン,ケルビンプローブ力顕微鏡