[19p-C5-1~12] Materials Science of Singularity in Nitride semiconductors～Characterization and Crystallography～

[19p-C5-2] Multi-Scale Characterization of Structural Properties of Singularity in Nitride Semiconductors

^○Akira Sakai¹, Shotaro Takeuchi¹, Yoshiaki Nakamura¹, Hideto Miyake², Kazumasa Hiramatsu², Yasuhiko Imai³, Shigeru Kimura³ (Osaka Univ.¹, Mie Univ.², JASRI/SPring-8³)

Keywords:X線マイクロ回折,マルチスケール,歪