4:00 PM - 6:00 PM
△ [19p-PB7-2] Evaluation of GaN crystal by X-rays topography.
Keywords:GaN,X線トポグラフィ,評価
Poster presentation
15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects
Fri. Sep 19, 2014 4:00 PM - 6:00 PM PB7 (Gymnasium2)
ポスター掲示時間16:00~18:00(PB7会場)
4:00 PM - 6:00 PM
Keywords:GaN,X線トポグラフィ,評価