[20a-A27-1~10] 14.1 Physical properties of exploratory materials

[20a-A27-5] Cross-sectional TEM observation of Ni-Mg₂Si interface prepared by SPS method

^○Hiroharu Sugawara¹, Yuki Yamazaki¹, Shin'ichi Nakamura², Shigeyuki Nakamura³, Yoshihisa Mori⁴, Ken'ichi Takarabe⁴ (Tokyo Metro. Univ.¹, Aoyama Gakuin Univ.², Tsuyama Nat. Coll. Tech.³, Okayama Univ. Sci.⁴)

Keywords:magnesium silicide,interface,TEM