[20a-C6-1~11] 3.9 THz technology

[20a-C6-11] Measurements of the thickness of a paint film on a metal surface by a double-modulation terahertz ellipsometer

^○Hiroaki Uemura¹, Yasuhiro Mizutani¹, Takeshi Yasui^1,2, Tetsuo Iwata¹ (Grad. School of the Univ. of Tokushima¹, Grad. School of Eng. Sci., Osaka Univ.²)

Keywords:THzエリプソメトリ,偏光計測,変調