The 75th JSAP Autumn Meeting, 2014

Presentation information

Poster presentation

13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[20a-PA2-1~11] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Sat. Sep 20, 2014 9:30 AM - 11:30 AM PA2 (Gymnasium1)

ポスター掲示時間9:30~11:30(PA2会場)

9:30 AM - 11:30 AM

[20a-PA2-5] Analytical Simulation of Reverse Recovery Characteristics for Body-Short Type Self-bias Channel Diode

Daisuke Yamada1, Tsugutomo Kudoh1, Fumihiko Sugawara2 (Kanagawa Inst.1, Tohoku Gakuin Univ.2)

Keywords:ダイオード,ショットキー,逆回復特性