[20p-A4-1~8] 12.4 Organic light-emitting devices and organic transistors

[20p-A4-4] Defect inspection of organic thin-film transistor array by charge-modulation imaging technique

^○Jun'ya Tsutsumi¹, Satoshi Matsuoka¹, Toshikazu Yamada¹, Tatsuo Hasegawa^1,2 (AIST¹, U.Tokyo²)

Keywords:トランジスタアレイ,欠陥検査,イメージング