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Symposium » Recent Trend of Analysis Techniques for Functional Materials and Devices

[15p-2H-1~6] Recent Trend of Analysis Techniques for Functional Materials and Devices

Tue. Sep 15, 2015 1:45 PM - 5:00 PM 2H (222)

座長:長康雄(東北大),菅原康弘(阪大)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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1:45 PM - 2:15 PM

[15p-2H-1] Scanning Probe Microscopy for Functional Materials and Devices

〇Yasuhiro Sugawara¹ (1.Osaka Univ.)

2:15 PM - 2:45 PM

[15p-2H-2] Dynamic SPM Nanocharacterization of Next Generation Photovoltaic Cells under Visible Light Irradiation

〇Daisuke Fujita¹, Nobuyuki Ishida¹ (1.Nat. Inst. Mat. Sci.)

2:45 PM - 3:15 PM

[15p-2H-3] Evaluation of Functional Materials Using Kelvin Probe Force Microscopy

〇Yanjun Li¹ (1.Osaka Univ.)

Break (3:15 PM - 3:30 PM)

3:30 PM - 4:00 PM

[15p-2H-4] Evaluation of Next Generation Power Semiconductor Devises Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy and Proposal of Scanning Nonlinear Dielectric Potentiometry

〇Yasuo Cho¹, Norimichi Chinone¹, Kotaro Hirose¹, Kohei Yamasue¹ (1.Tohoku Univ.)

4:00 PM - 4:30 PM

[15p-2H-5] Characterization of Carbon Materials using Raman Scattering Spectroscopy and Atomic Force Microscopy

〇Masamichi Yoshimura¹, Ryo Uehara¹, Seiya Suzuki¹ (1.Toyota Tech. Inst.)

4:30 PM - 5:00 PM

[15p-2H-6] Site-Specific, High Spatial Resolution and High Sensitivity 2D Carrier Profiling of Si devices with Scanning Spreading Resistance Microscopy (SSRM)

〇Li Zhang¹ (1.Toshiba R&D Center)

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