Oral presentation

6 Thin Films and Surfaces » 6.1 Ferroelectric thin films

[15p-2L-1~13] 6.1 Ferroelectric thin films

Tue. Sep 15, 2015 1:45 PM - 5:15 PM 2L (2F Lounge 2)

座長:藤沢浩訓(兵庫県立大)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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1:45 PM - 2:00 PM

△ [15p-2L-1] Fabrication and characterization of orthorhombic Sc_xFe_2-xO₃ films

〇Yousuke Hamasaki¹, Shintaro Yasui¹, Tomoyasu Taniyama¹, Mitsuru Itoh¹ (1.Tokyo Tech. MSL)

2:00 PM - 2:15 PM

[15p-2L-2] Fabricatation of Novel Lead-free Ferroelectric Bi₂ZnTi_1-xMn_xO₆ Thin Films

〇ken tominaga¹, Hajime Hojo¹, Keisuke Shimizu¹, Narumi Matsuda¹, Masaki Azuma¹ (1.Tokyo Tech)

2:15 PM - 2:30 PM

[15p-2L-3] Domain structure in {100}- and {111}-oriented Pb(Zr,Ti)O₃ nanorods and its size dependence

〇Tomoaki Yamada^1,2, Daisuke Ito¹, Osami Sakata^3,4, Junki Kuroishi⁵, Takahiro Namazu⁵, Takao Shimizu⁴, Hiroshi Funakubo⁴, Masahito Yoshino¹, Takanori Nagasaki¹ (1.Nagoya Univ., 2.JST-PRESTO, 3.NIMS, 4.Tokyo Tech., 5.Univ. Hyogo)

2:30 PM - 2:45 PM

[15p-2L-4] Effect of Temperature and In-plane Strain on Domain Structure in (100)/(001)-oriented Epitaxial PbTiO₃ Films

〇Hiroshi Funakubo¹, Takaaki Nakashima¹, Daichi Ichinose¹, Yoshitaka Ehara¹, Mitsumasa Nakasjimama¹, Takao Shimizu¹, Takeshi Kobayashi², Takashi Iijima², Tomoaki Yamada^3,4 (1.Tokyo Tech., 2.AIST, 3.Nagoya Univ., 4.PRESTO)

2:45 PM - 3:00 PM

△ [15p-2L-5] Effect of Zr/(Zr+Ti) Ratio on Domain Structure in Tetragonal Pb(Zr,Ti)O₃ Thin Film

〇Daichi Ichinose¹, Takaaki Nakashima¹, Yoshitaka Ehara¹, Takao Shimizu¹, Osami Sakata^2,3, Tomoaki Yamada^4,5, Hiroshi Funakubo¹ (1.Tokyo Tech, 2.NIMS, 3.SPring-8, 4.Nagoya Univ., 5.PRESTO)

3:00 PM - 3:15 PM

[15p-2L-6] Deposition and composition dependence of Pb(Hf,Ti)O₃ thin films

〇Shogo Nishio¹, Fumiya Kurokawa¹, Yuichi Tsujiura¹, Hirotaka Hida¹, Isaku Kanno¹ (1.Kobe Univ.)

3:15 PM - 3:30 PM

[15p-2L-7] Quantitative Analysis of Crystal Structure Change Under electric Filed by XRD Measurement for (100)/(001)-oriented Tetragonal Pb(Zr, Ti)O₃ Films

〇Hiroshi Funakubo¹, Naoya Oshima¹, Takao Shimizu¹, Mitsumasa Nakajima¹, Yoshitaka Ehara¹, Takahiro Oikawa¹, Hiroshi Uchida² (1.Tokyo Tech., 2.Sophia Univ.)

Break (3:30 PM - 3:45 PM)

3:45 PM - 4:00 PM

△ [15p-2L-8] Growth of epitaxial orthorhombic HfO₂-based films on Si substrate

〇Kiliha Katayama¹, Takao Shimizu², Takanori Kiguchi³, Akihiro Akama³, Konno Toyohiko³, Hiroshi Uchida⁴, Osami Sakata⁵, Hiroshi Funakubo^1,2 (1.Tokyo Tech. IGS, 2.Tokyo Tech. MCES, 3.Tohoku Univ. IMR, 4.Sophia Univ. FST, 5.NIMS)

4:00 PM - 4:15 PM

[15p-2L-9] Domain Structure in epitaxial orthorhombic HfO₂-based films

〇Takao Shimizu¹, Kiliha Katayma², Takanori Kiguchi³, Takahiro Akama³, Toyohiko Konno³, Hiroshi Uchida⁴, Osami Sakata⁵, Hiroshi Funakubo^1,2 (1.Tokyo Tech. MCES, 2.Tokyo Tech. IGS, 3.Tohoku Univ., 4.Sophia Univ. FST, 5.NIMS)

4:15 PM - 4:30 PM

[15p-2L-10] Thermal stability of (BiFe_1-XZn_X/2Ti_X/2O₃) sputtered epitaxial thin films

〇(M2)Daiki Kodera¹, Takuya Kumagai¹, Kyokane Hirokazu¹, Yokota Takeshi¹, Gomi Manabu¹ (1.Nagoya Inst Tech)

4:30 PM - 4:45 PM

[15p-2L-11] Research on composition variation during the deposition of YbFe₂O₄thin films by using PLD method

〇Ryo Kashimoto¹, Takeshi Yoshimura¹, Atsushi Ashida¹, Norifumi Fujimura¹ (1.Osaka prefecture Univ.)

4:45 PM - 5:00 PM

[15p-2L-12] Magneto-capacitance properties of magneto-electric epitaxial multilayer Cr₂O₃/LiNbO₃

〇Takeshi Yokota¹, Izuna Tsuboi¹, Kazuki Hiramatsu¹, Manabu Gomi¹ (1.Nagoya Inst. Tech.)

5:00 PM - 5:15 PM

[15p-2L-13] Low temperature formation of Pb(Zr,Ti)O₃ films by thermal UV/O₃ treatment in solution process

〇Yuki Tagashira¹, Phan Trong Tue^1,2, Reijiro Shimura¹, Keisuke Satou^1,3, Kazuhiro Fukada^1,2, Jinwang Li¹, Tatsuya Shimoda^1,2, Yuzuru Takamura^1,2 (1.JAIST, 2.JST-CREST, 3.JSR)

Session information

[15p-2L-1~13] 6.1 Ferroelectric thin films

△ [15p-2L-1] Fabrication and characterization of orthorhombic Sc_xFe_2-xO₃ films

[15p-2L-2] Fabricatation of Novel Lead-free Ferroelectric Bi₂ZnTi_1-xMn_xO₆ Thin Films

[15p-2L-3] Domain structure in {100}- and {111}-oriented Pb(Zr,Ti)O₃ nanorods and its size dependence

[15p-2L-4] Effect of Temperature and In-plane Strain on Domain Structure in (100)/(001)-oriented Epitaxial PbTiO₃ Films

△ [15p-2L-5] Effect of Zr/(Zr+Ti) Ratio on Domain Structure in Tetragonal Pb(Zr,Ti)O₃ Thin Film

[15p-2L-6] Deposition and composition dependence of Pb(Hf,Ti)O₃ thin films

[15p-2L-7] Quantitative Analysis of Crystal Structure Change Under electric Filed by XRD Measurement for (100)/(001)-oriented Tetragonal Pb(Zr, Ti)O₃ Films

△ [15p-2L-8] Growth of epitaxial orthorhombic HfO₂-based films on Si substrate

[15p-2L-9] Domain Structure in epitaxial orthorhombic HfO₂-based films

[15p-2L-10] Thermal stability of (BiFe_1-XZn_X/2Ti_X/2O₃) sputtered epitaxial thin films

[15p-2L-11] Research on composition variation during the deposition of YbFe₂O₄thin films by using PLD method

[15p-2L-12] Magneto-capacitance properties of magneto-electric epitaxial multilayer Cr₂O₃/LiNbO₃

[15p-2L-13] Low temperature formation of Pb(Zr,Ti)O₃ films by thermal UV/O₃ treatment in solution process

Authentication

Session information

[15p-2L-1~13] 6.1 Ferroelectric thin films

△ [15p-2L-1] Fabrication and characterization of orthorhombic ScxFe2-xO3 films

△ [15p-2L-5] Effect of Zr/(Zr+Ti) Ratio on Domain Structure in Tetragonal Pb(Zr,Ti)O3 Thin Film

△ [15p-2L-8] Growth of epitaxial orthorhombic HfO2-based films on Si substrate

Authentication

△ [15p-2L-1] Fabrication and characterization of orthorhombic Sc_xFe_2-xO₃ films

△ [15p-2L-5] Effect of Zr/(Zr+Ti) Ratio on Domain Structure in Tetragonal Pb(Zr,Ti)O₃ Thin Film

△ [15p-2L-8] Growth of epitaxial orthorhombic HfO₂-based films on Si substrate