The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

3 Optics and Photonics » 3.1 Basic optics and frontier of optics

[13p-2E-1~16] 3.1 Basic optics and frontier of optics

Sun. Sep 13, 2015 1:45 PM - 6:15 PM 2E (221-1)

座長:田中 嘉人(東大),宮本 克彦(千葉大),庄司 暁(電通大)

5:30 PM - 5:45 PM

[13p-2E-14] Non-destructive measurement of evanescent field by scanning a highly scattering particle

〇(M1C)Taihei Okamoto1, Inami Wataru1,2, Kawata Yoshimasa1,2 (1.Shizuoka Univ., 2.Shizuoka Univ. Electronics inst.)

Keywords:evanescent field,measurement

Evanescent field localized at the interface with the total internal reflection. Although the amplitude distribution is well known long time and theoretically derived easily, it is difficult to detect experimentally. Because the probe inserted in the region of evanescent field disturbs the distribution. This time, we proposed a technique to detect the amplitude without disturbing. The principle of the technique is verified with FDTD simulation result.