Evaluation of Stress in Thin Film Ge<sub>1-x</sub>Sn<sub>x</sub> on Ge Substrate by Oil-Immersion Raman Spectroscopy

Presentation information

Oral presentation

15 Crystal Engineering » 15.5 Group IV crystals and alloys

Sun. Sep 13, 2015 1:15 PM - 5:30 PM 2W (234-2(North))

座長:黒澤昌志(名大),都甲薫(筑波大)

4:00 PM - 4:15 PM

〇Kazuma Takeuchi¹, Shotaro Yamamoto¹, Ryo Yokogawa¹, Naomi Sawamoto¹, Kohei Suda¹, Seiya Ishihara¹, Atsushi Ogura¹ (1.Meiji Univ.)

Keywords:Raman spectroscopy,Germanium Tin