The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.5 Surface Physics, Vacuum

[13p-4E-1~20] 6.5 Surface Physics, Vacuum

Sun. Sep 13, 2015 1:15 PM - 6:45 PM 4E (437)

座長:小川 修一(東北大),大野 真也(横国大)

4:45 PM - 5:00 PM

[13p-4E-14] Synchrotron Radiation Photoemission Electron Microscope Observation of Cs-containing Clay Mineral

〇Akitaka Yoshigoe1, Hidehiro Shiwaku1, Tooru Kobayashi1, Iwao Shimoyama1, Daiju Matsumura1, Takuya Tsuji1, Yasuo Nishihata1, Tsuyoshi Yaita1, Toshihiro Kogure2, Satoko Motai2, Takuo Ohkochi3 (1.JAEA, 2.The Univ. of Tokyo, 3.JASRI)

Keywords:Photoemission Electron Microscope,Synchrotron Radiation,Pinpoint surface chemical analysis

Fundamental researches on adsorption state of radiaoactive Cs in clay mineral (aluminosilicate) have become important from the virewpoints of development of decontamination/volume-reduction techniques since the accident of Fukushima Daiiichi Nuclear Power Station. Pinpoint surface chemical analysis with sub-μm spatial resolutions focusing on a target sample has been needed. In this presentation, I will show our recent work on nanoscale pinpoint surface chemical analysis for Cs-containing clay mineral by means of synchrotron radiation PEEM at BL17SU in SPring-8.