1:30 PM - 3:30 PM
▼ [13p-PA1-18] Optical and magneto-optical properties of GdFe thin films in the photon energy range from 1.5 to 5.5 eV
Keywords:permittivity tensor,GdFe,magneto-optical materials
Considerable attention has been paid to magnetic and magneto-optical (MO) properties of GdFe thin films because this material provides significant advantages, such as large magnetization density, and possibility to adjust its compensation temperature, coercive and saturation magnetization by changing the composition [1,2]. Moreover, GdFe enables direct access to its spins through the electromagnetic interactions, which makes it subject of importance for future magnetic recording (such as heat assisted magnetic recording) and information processing technologies [3].
In this work, we present a systematic study of optical and MO properties of amorphous Gd22Fe78 thin films prepared by DC sputtering on thermally oxidized Si substrates. Thin SiNx and Ru capping layers were used to prevent the Gd22Fe78 surface oxidation and contamination. Spectroscopic ellipsometry and MO Kerr effect spectroscopy (Fig.1) were employed as characterization techniques. A confrontation of ellipsometric and MO experimental data with advanced theoretical calculations provided a spectral dependence of complete permittivity tensor and a spectral dependence of the absorption coefficient in a wide spectral range. No significant changes in the permittivity tensors with different capping layers were observed, indicating a good material stability of Gd22Fe78 layer and validity of our characterization techniques.
This research was supported by the National Institute of Information and Communications Technology (NICT).
1. M. Urner-Wille, K. Witter, J. Magn. Magn. Mater. 13(1-2), 77–80 (1979).
2. S. Sugano and N. Kojima, Magneto-Optics (Springer, 2011).
3. L. Le Guyader et al., Appl. Phys. Lett. 101(2), 022410 -1-4 (2012).
In this work, we present a systematic study of optical and MO properties of amorphous Gd22Fe78 thin films prepared by DC sputtering on thermally oxidized Si substrates. Thin SiNx and Ru capping layers were used to prevent the Gd22Fe78 surface oxidation and contamination. Spectroscopic ellipsometry and MO Kerr effect spectroscopy (Fig.1) were employed as characterization techniques. A confrontation of ellipsometric and MO experimental data with advanced theoretical calculations provided a spectral dependence of complete permittivity tensor and a spectral dependence of the absorption coefficient in a wide spectral range. No significant changes in the permittivity tensors with different capping layers were observed, indicating a good material stability of Gd22Fe78 layer and validity of our characterization techniques.
This research was supported by the National Institute of Information and Communications Technology (NICT).
1. M. Urner-Wille, K. Witter, J. Magn. Magn. Mater. 13(1-2), 77–80 (1979).
2. S. Sugano and N. Kojima, Magneto-Optics (Springer, 2011).
3. L. Le Guyader et al., Appl. Phys. Lett. 101(2), 022410 -1-4 (2012).