[13p-PA6-1~17] 13.9 Optical properties and light-emitting devices

[13p-PA6-15] Measurement of the nonlinear refractive index of InP thick film using Z-scan technique

〇(M1)YuuKi Ikeda¹, Hiroyuki Bando¹, Hikaru Hara¹, Masaki Oishi¹, Toshio Matsusue¹ (1.Chiba University)

Keywords:nonlinear refractive index,Z-scan