The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.4 Buried interface sciences with quantum beam

[14a-4E-1~7] 7.4 Buried interface sciences with quantum beam

Mon. Sep 14, 2015 9:30 AM - 11:15 AM 4E (437)

座長:竹田 美和(あいち放射光)

9:45 AM - 10:00 AM

[14a-4E-2] Neutron reflectivity measurements of Au-Cr thin film contact to sulfuric acid

〇Mari Mizusawa1, Kenji Sakurai2, Dai Yamazaki3, Masayasu Takeda3 (1.CROSS Tokai, 2.NIMS, 3.JAEA/J-PARC)

Keywords:solid liquid interface,neutron,reflectivity

Neutron reflectivity is useful for measuring the buried structure such as electrode/electrolyte interface. In this experiment, the reflectivity profile of the stacked thin layer of Au and Cr on Si substrate contact with sulfric acid shows relatively strong scatter in 0.5<q<1.5nm-1.