9:30 AM - 11:30 AM
[14a-PA2-6] Developments of optical birefringence of imaging system under high electric fields
Keywords:birefringence,high electric fields
We have developed temperature dependence of the birefringence imaging systems to obtain the two-dimensional information about the retardation and azimuth angle. Birefringence is generally important method when transparent crystals are evaluated. In the present exhibitions, the birefringence imaging systems under high electric fields will be reported when the high voltage is applied perpendicular to propagating the light source. We show the response from high electric fields, i.e., the Pockels effect and the Kerr effect, with varying temperature.