The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.4 Si wafer processing /MEMS/Integration technology

[14p-1C-1~16] 13.4 Si wafer processing /MEMS/Integration technology

Mon. Sep 14, 2015 1:15 PM - 5:30 PM 1C (135)

座長:中村 友二(富士通研),筑根 敦弘(大陽日酸)

5:15 PM - 5:30 PM

[14p-1C-16] Development of silicon film growth at high rate in SiHCl3-SiHx-H2 system

〇Ayumi Saito1, Ayumi Sakurai1, Hitoshi Habuka1 (1.Yokohama Nat. Univ.)

Keywords:Silicomepitaxy,Growth rate,Reaction mechanism

In order to exceed the silicon epitaxial growth rate saturation caused by the Langmuir–type surface reaction mechanism, we designed a new surface process utilizing an addition of SiHx gas to SiHCl3 gas. The new process could be verified based on the epitaxial growth rate increase with the increasing SiHx gas flow rate. Its detail will be discussed.