[14p-2A-1~17] 12.3 Functional Materials and Novel Devices

[14p-2A-12] Molecular Orientation of Poly(3-hexylthiophene) near a Surface and a Substrate interface in thin films

〇Tasuku Mizuno¹, Ohno Keita¹, Hara Mitsuo¹, Nagano Shusaku², Yamamoto Katsuhiro³, Seki Takahiro¹ (1.Nagoya Univ., 2.Nagoya Univ. VBL, 3.Nagoya Inst. of Tec.)

Keywords:semiconductive polymer,molecular orientation,GI-SAXS

We investigated molecular orientation for semiconductive polymer in ultrathin films by grazing incidence small-angle X-ray scattering measurement (GI-SAXS). HT-poly(3-hexylthiophene)(P3HT) ultrathin films with various thickness were prepared by spin-coating. The scattering peaks corresponding to P3HT lamella structure were observed in out-of-plane and in-plane direction by GI-SAXS measurements. The out-of-plane and in-plane scatterings were assigned to edge-on and face-on orientated domains of P3HT. In a thick film, the out-of-plane scattering was strongly observed, indicating that P3HT prefrentially built up edge-on orientation. With decrease of the film thickness, the edge-on peak intensity was weakened. On the other hand, the face-on scatterings was almost unchanged with the thickness. These results suggest that the face-on orientation domain were preferencial near a substrate surface.