The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.6 Ion beams

[14p-4E-1~21] 7.6 Ion beams

Mon. Sep 14, 2015 12:30 PM - 6:15 PM 4E (437)

座長:阿保 智(阪大),瀬木 利夫(京大),柳沢 淳一(滋賀県立大)

3:30 PM - 3:45 PM

[14p-4E-12] Continuous measurement of IL spectroscopy from organic targets with external proton microbeam probe

〇Wataru Kada1, Takahiro Satoh2, Shunsuke Kawabata1,2, Masashi Koka2, Naoto Yamada2, Akihito Yokoyama1,2, Tomihiro Kamiya2, Kenta Miura1, Osamu Hanaizumi1 (1.Gunma Univ., 2.JAEA)

Keywords:IL,external ion microbeam,microscopic spectroscopy

Particle-Induced X-ray Emission (PIXE) analysis using external proton microbeam probe is effective tool to analyze elemental distribution of inorganic and organic samples without any particular treatment. Even elemental composition of biological samples would be able to be analyzed in normal atmospheric condition therefore its application area has expanded in various research filed including medical applications. On the other hand, organic molecules would be damaged even under such external ion beam irradiation condition, however, these changes are not able to be obtained through the characteristic X-rays. To obtain these chemical composition during PIXE analysis, a continuous spectroscopic analysis of Ion Luminescence (IL) was performed with several organic targets. The differences were found in IL peak wavelength, structure of the spectrum, and even decay of the IL peaks for each organics. These results suggest that IL could complementary technique for PIXE analysis especially for the biological target where the irradiation damages play important role in the analytical results.