[14p-PB5-1~15] 12.2 Characterization and Materials Physics

[14p-PB5-9] Molecular Alignments of Sigma Phase in Co-evaporated Film of PEN and PFP
by Grazing-Incidence X-ray Diffraction

〇Ichiro Hirosawa¹, Takeshi Watanabe¹, Koganesawa Tomoyuki¹, Tada Keisuke², Yoshimoto Noriyuki² (1.JASRI, 2.Iwate Univ.)

Keywords:organic semiconductor,crystal structure

Molecular alignments of sigma phase in PEN/PEP co-evapolated film on SiO₂ was studied by grazing-incidence X-ray diffraction at BL46XU in SPring-8. Observed diffraction patten cannot clarify which is in the sigma phase order, or disorder.