The 76th JSAP Autumn Meeting, 2015

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Poster presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[14p-PB7-1~5] 15.8 Crystal evaluation, impurities and crystal defects

Mon. Sep 14, 2015 4:00 PM - 6:00 PM PB7 (Shirotori Hall)

4:00 PM - 6:00 PM

△ [14p-PB7-4] Evaluation of GaN wafer for power devices by Raman spectroscopy(3)

〇(M1)naoki ikeda1, hidekazu yamamoto1 (1.Chiba Institute of Technology)

Keywords:PawarDevice,GaN