10:30 AM - 10:45 AM
[15a-2H-5] The Shape Analysis of ReRAM Filament by Temperature Characteristics Measurement
Keywords:ReRAM,NiO,temperature characteristics
Oral presentation
6 Thin Films and Surfaces » 6.3 Oxide electronics
Tue. Sep 15, 2015 9:30 AM - 12:00 PM 2H (222)
座長:中村 芳明(阪大)
10:30 AM - 10:45 AM
Keywords:ReRAM,NiO,temperature characteristics