[15a-2H-1~10] 6.3 Oxide electronics

[15a-2H-9] In-situ TEM observation of a planar-type ReRAM with Cu nanogap structures

〇Ryota Yonesaka¹, Yosuke Murakami¹, Atsushi Tsurumaki-Fukuchi¹, Masashi Arita¹, Yasuo Takahashi¹ (1.Graduate School of IST, Hokkaido Univ.)

Keywords:ReRAM,In-situ TEM