1:45 PM - 2:00 PM
[15p-1C-3] Dependence of Soft Errors in SOI-SRAM on Distribution of Energy Deposition by High-Energy Heavy-Ion Incidence
Keywords:soft error,SOI-SRAM,reliability
Oral presentation
13 Semiconductors » 13.5 Semiconductor devices and related technologies
Tue. Sep 15, 2015 1:15 PM - 6:00 PM 1C (135)
座長:齋藤 真澄(東芝),入沢 寿史(産総研)
1:45 PM - 2:00 PM
Keywords:soft error,SOI-SRAM,reliability