The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[15p-1E-1~10] 3.8 Optical measurement, instrumentation, and sensor

Tue. Sep 15, 2015 1:30 PM - 4:30 PM 1E (143)

座長:井上 卓(浜松ホトニクス),鈴木 二郎(三菱電機)

3:30 PM - 3:45 PM

[15p-1E-7] Improvement of resolution in birefringence profiler using polarization-diffractive gratings and imaging system

〇Ryohei Nakajima1, Naoki Ohtani1, Takashi Fukuda2, Akira Emoto1 (1.Doshisha Univ., 2.AIST)

Keywords:birefringence,polarization,nanoimprint