[15p-2D-1~8] 4.6 Nanocarbon and 2D materials photonics

▲ [15p-2D-6] Optical identification of grain boundaries of monolayer MoS₂

〇Jeongyong Kim¹ (1.CINAP, IBS, SKKU)

キーワード：MoS2,grain boundary,near-field imaging

We used NSOM PL imaging with ~100 nm spatial resolution and showed that NSOM PL imaging can identify the nanoscale structural defects, as small as ~20 nm in size, such as grain boundaries or ad-layers of CVD grown monolayer MoS₂, which were not distinguished by conventional confocal PL imaging.