[15p-2S-1~14] 16.3 Bulk, thin-film and other silicon-based solar cells

[15p-2S-9] A Characterization of PID of PV modules using Laser Terahertz Emission Microscope(LTEM)

HIDETOSHI NAKANISHI¹, 〇FUJIKAZU KITAMURA¹, KIYOTAKA MATSUO¹, MINORU MIZUBATA¹, KATSUHIKO SHIRASAWA², TOSHIMITSU MOCHIZUKI², HIDETAKA TAKATO², IWAO KAWAYAMA³, MASAYOSHI TONOUCHI³ (1.SCREEN, 2.FREA,AIST, 3.ILE Osaka Univ.)

Keywords:Terahertz,Photovoltaic,Femtosecond laser

A laser terahertz emission microscope (LTEM) is a non-contact inspection technique based on a THz emission spectroscopy and imaging that can visualize intensity of pulsed terahertz radiation from the materials and devices excited by femtosecond laser pulses.LTEM images theoretically include the information about the variance of photoexcited carriers in the vicinity of the depletion layer.In this study, we experimentally compared LTEM images of PID of PV with EL.